test: delete dead @test gates 910/997 — coverage re-hosted in E2-C2 (M4 E3-C2, #22)
910_at_test.c and 997_at_test_ww.c build via `ww build` then read <stem>.combined.ww as a driver side-effect; the E3 flip removes that side-effect, so they cannot pass post-flip. Their coverage was fully re-hosted in E2-C2 -- every axis (run-exit, -T cs/ww byte-id, the userman/badsig/undefbody/linkfail rejects, the dup-decl family, modfn coexist, user `fn run` coexist) has a live home in 989_septest_run, 911_attest_drop, or 989_declns_sep, several strengthened. Deleting them before the flip keeps `make test` bisect-clean. Also retargets a stale 'Sibling of 910_at_test' doc comment in 911_attest_record.c to the surviving gates.
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@@ -1,8 +1,8 @@
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/*
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* 911_attest_record — #17 record-and-continue harness (lib/test + the
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* table-synth -T entry). Sibling of 910_at_test (which pins the synth
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* itself + the #6 non-T drop); this one pins the RUNTIME behaviour the
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* fork+wait4 runner adds:
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* table-synth -T entry). Sibling of 989_septest_run + 911_attest_drop
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* (which pin the synth entry itself + the #6 non-T drop); this one pins
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* the RUNTIME behaviour the fork+wait4 runner adds:
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*
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* 1. RECORD-AND-CONTINUE — `ww test` the mixed fixture (one pass, then
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* assert-fail/SIGSEGV/SIGFPE, then a final pass). The runner must
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