test/wcc/data: pin the drained divergences at runtime
The four graduated pin families byte-compared under test-data-byteid but their original fixtures masked the miscompiles at runtime (lone frame slot, dead code path, pointer accident). Add the discriminating programs as run fixtures: adjacent-element clobber for the 2-byte deref store, second-variant match dispatch for fn-type dedup, payload integrity across the tagged widen of a padded struct, and base64 clear() actually zeroing its buffers. Corpus pins move to 1,229 fixtures / 137 run / 766 run-exit / 2,458 cells with the new identity hash; the data-byteid floor moves to 915.
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test/wcc/data/r660_i16_deref_store_adjacent/case.ww
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test/wcc/data/r660_i16_deref_store_adjacent/case.ww
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//ww:run-exit 42
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package main;
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fn setneg(p: *i16) void = { *p = -16i64: i16; };
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fn main() i32 = {
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let a: [4]i16 = [7i16, 7i16, 7i16, 7i16];
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setneg(&a[0]);
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if (a[0]: i64 == -16i64 && a[1] == 7i16 && a[2] == 7i16 && a[3] == 7i16) { return 42; };
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return 1;
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};
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